Our new electron microscope is one of the latest in the range of ZEISS environmental SEM instruments, capable of high resolution imaging at low vacuum (2000 Pa, equivalent to air pressure at about 20 km altitude) with water injection into the analytical chamber.
Calibrations are complete and the LaB6 high intensity electron source is giving better than 3 nm resolution at 20 kV. See our NBS traceable graticule above and below.
Our new SEM is fitted with the same high quality, reproducible and trusted EDS detectors from Oxford Instruments as our first SEM, and at 80 mm2 area, the detector can be optimised at 300Kcps, building x-ray maps in minutes instead of hours. See oxygen x-ray map of a precipitate, below, acquired in under 5 minutes.